A microscope for hard x-rays based on parabolic compound refractive lenses
Creators
- 1. 2. Physikalisches Institut, RWTH Aachen, D-52056 Aachen (Germany)
- 2. European Synchrotron Radiation Facility ESRF, BP220, F-38043 Grenoble (France)
Description
We describe refractive x-ray lenses with parabolic profile that are genuine imaging devices, similar to glass lenses for visible light. They open considerable possibilities in x-ray microscopy, tomography, microanalysis, and coherent scattering. Based on these lenses a microscope for hard x-rays is described, that can operate in the range from 2 to 60 keV, allowing for magnifications up to 50. At present, using aluminum lenses, it is possible to image an area of about 300μm in diameter with a resolving power of 0.3μm. Using beryllium as a lens material, the resolution can be increased below 0.1μm. The microscope allows to image opaque samples without destructive sample preparation and without the need of a vacuum chamber. It is particularly useful for in situ studies of wet samples, like biological and geological specimens. Imaging in both absorption and phase contrast is possible
Additional details
Identifiers
- DOI
- 10.1063/1.1291168;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 507
- Journal Issue
- 1
- Journal Page Range
- p. 340-345
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 6. international conference on X-ray microscopy
- Dates
- 2-6 Aug 1999
- Place
- Berkeley, CA (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35069975
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALUMINIUM; BERYLLIUM; FRESNEL LENS; HARD X RADIATION; IMAGES; MICROANALYSIS; MICROSCOPES; MICROSCOPY; MODULATION; REFRACTIVE INDEX; SAMPLE PREPARATION; SPATIAL RESOLUTION; X-RAY DIFFRACTION
- Descriptors DEC
- ALKALINE EARTH METALS; COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELEMENTS; IONIZING RADIATIONS; LENSES; METALS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATIONS; RESOLUTION; SCATTERING; X RADIATION
Optional Information
- Notes
- (c) 2000 American Institute of Physics.