Published 2001 | Version v1
Book

Optical and structural properties of two sourced evaporation of CdTe films

  • 1. Quid-e-Azam Univ., Islamabad (Pakistan). Physics Dept.
  • 2. Pakistan Inst. of Nuclear Science and Technology, Islamabad (Pakistan). Radiation Damage Group
  • 3. Dr. A.Q.Khan Research Labs., Rawalpindi (Pakistan)

Description

Optical properties of CdTe films, deposited by thermal evaporation of Cd and Te sources, were studied in the range of 500 - 2000 nm by UV - VIS - NIR spectrometer. Absorption coefficient, refractive index, optical band gap, X-ray diffraction (XRD) and resulted chemical composition of the films, by electron microprobe analyzer (EMPA), have been reported for CdTe films formed at substrate temperature of 250 and 400 deg. C with different evaporation rates. (author)

Part of:
Advanced materials 2001

Additional details

Publishing Information

Publisher
Doctor A.Q. Khan Research Labs., Islamabad Pakistan
Imprint Place
Islamabad (Pakistan)
Imprint Title
Advanced materials 2001
Imprint Pagination
520 p.
Journal Page Range
p. 353-359

Conference

Title
7. International Symposium on Advanced Materials
Dates
17-21 Sep 2001
Place
Islamabad (Pakistan)

Optional Information