A novel integrated spatial filtering detector chip with variable multi-valued weighting functions
Creators
- 1. SAMSUNG TECHWIN CO., LTD., 145-3 Sandaewon 1-Dong, Sungnam, Kyunggi-Do (Korea, Republic of)
- 2. Tokyo Institute of Technology, 2-12-1 O-okayama, Meguro-ku, Tokyo (Japan)
Description
A novel integrated spatial filtering detector chip was introduced in this paper through the comparison with the conventional spatial filtering detectors. We designed and fabricated a novel integrated spatial filtering detector chip with variable multi-valued weighting function using CMOS 0.35μm process. This chip has 7-bit signed weight values and a weighting control circuit though the external interface with the PC. The multiplication of the frequencies is available from the dividing the weighting function of the chip. In order to con.rm the validity of this chip, a simple velocity measurement was achieved. Experimental results show multiplied frequency ratio regarding to the reference frequency which are in proportion to the velocity of the measuring object
Availability note (English)
Available online at http://stacks.iop.org/1742-6596/34/680/jpconf6_34_112.pdf or at the Web site for the Journal of Physics. Conference Series (Online) (ISSN 1742-6596) http://www.iop.org/Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 34
- Journal Issue
- 1
- Journal Page Range
- p. 680-685
- ISSN
- 1742-6596
Conference
- Title
- International MEMS conference 2006
- Acronym
- iMEMS2006
- Dates
- 9-12 May 2006
- Place
- Singapore (Singapore)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37058582
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COMPARATIVE EVALUATIONS; CONTROL; INTERFACES; MICROELECTRONICS; MOS TRANSISTORS; VELOCITY; WEIGHTING FUNCTIONS
- Descriptors DEC
- EVALUATION; FUNCTIONS; SEMICONDUCTOR DEVICES; TRANSISTORS