Published April 1, 2006 | Version v1
Journal article

A novel integrated spatial filtering detector chip with variable multi-valued weighting functions

  • 1. SAMSUNG TECHWIN CO., LTD., 145-3 Sandaewon 1-Dong, Sungnam, Kyunggi-Do (Korea, Republic of)
  • 2. Tokyo Institute of Technology, 2-12-1 O-okayama, Meguro-ku, Tokyo (Japan)

Description

A novel integrated spatial filtering detector chip was introduced in this paper through the comparison with the conventional spatial filtering detectors. We designed and fabricated a novel integrated spatial filtering detector chip with variable multi-valued weighting function using CMOS 0.35μm process. This chip has 7-bit signed weight values and a weighting control circuit though the external interface with the PC. The multiplication of the frequencies is available from the dividing the weighting function of the chip. In order to con.rm the validity of this chip, a simple velocity measurement was achieved. Experimental results show multiplied frequency ratio regarding to the reference frequency which are in proportion to the velocity of the measuring object

Availability note (English)

Available online at http://stacks.iop.org/1742-6596/34/680/jpconf6_34_112.pdf or at the Web site for the Journal of Physics. Conference Series (Online) (ISSN 1742-6596) http://www.iop.org/

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
34
Journal Issue
1
Journal Page Range
p. 680-685
ISSN
1742-6596

Conference

Title
International MEMS conference 2006
Acronym
iMEMS2006
Dates
9-12 May 2006
Place
Singapore (Singapore)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37058582
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
COMPARATIVE EVALUATIONS; CONTROL; INTERFACES; MICROELECTRONICS; MOS TRANSISTORS; VELOCITY; WEIGHTING FUNCTIONS
Descriptors DEC
EVALUATION; FUNCTIONS; SEMICONDUCTOR DEVICES; TRANSISTORS