Calibration of a tabletop confocal microbeam R-ray fluorescence spectrometer for a quantitative depth profiles evaluation
Creators
- 1. Czech Technical University in Prague, Faculty of Nuclear Sciences and Physical Engineering, Brehova 7, 115 19 Prague (Czech Republic)
Description
Confocal micro-beam X-ray fluorescence analysis (confocal micro-XRF) is a non-destructive analytical tool for investigation of sample composition that enables acquiring three-dimensionally resolved information. This work describes a calibration procedure of a laboratory confocal micro-XRF setup, which leads to determination of its characteristic parameters. The calibration is performed using a tabletop confocal micro-XRF spectrometer designed recently at the Czech Technical University in Prague. The calibration procedure performed within this work comprises the essential steps of the setup characterization: excitation spectrum calculation, experimental determination of energy-dependent confocal volume size and integral sensitivity and calculation of the spectrometer sensitivity function. The results of the setup calibration will be used for development of a procedure enabling quantitative evaluation of the measured depth profiles. (authors)
Availability note (English)
Available from doi: http://dx.doi.org/10.1093/rpd/ncz216Additional details
Identifiers
- DOI
- 10.1093/rpd/ncz216;
Publishing Information
- Journal Title
- Radiation Protection Dosimetry
- Journal Volume
- 186
- Journal Issue
- 2-3
- Journal Page Range
- p. 268-273
- ISSN
- 0144-8420
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- France
- INIS RN
- 51102221
- Subject category
- S61: RADIATION PROTECTION AND DOSIMETRY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- CALIBRATION; DEPTH DOSE DISTRIBUTIONS; EVALUATION; EXCITATION; FLUORESCENCE; SENSITIVITY; SPECTRA; SPECTROMETERS; THREE-DIMENSIONAL LATTICES; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- CHEMICAL ANALYSIS; CRYSTAL LATTICES; CRYSTAL STRUCTURE; EMISSION; ENERGY-LEVEL TRANSITIONS; LUMINESCENCE; MEASURING INSTRUMENTS; NONDESTRUCTIVE ANALYSIS; PHOTON EMISSION; RADIATION DOSE DISTRIBUTIONS; SPATIAL DOSE DISTRIBUTIONS; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- 15 refs.