Published October 1, 2013 | Version v1
Journal article

Direct modification of silicon surface by nanosecond laser interference lithography

  • 1. JR3CN and IRAC (University of Bedfordshire), Luton LU1 3JU (United Kingdom)
  • 2. JR3CN and CNM (Changchun University of Science and Technology), Changchun 130022 (China)

Description

Periodic and quasi-periodic structures on silicon surface have numerous significant applications in photoelectronics and surface engineering. A number of technologies have been developed to fabricate the structures in various research fields. In this work, we take the strategy of direct nanosecond laser interference lithography technology, and focus on the silicon material to create different well-defined surface structures based on theoretical analysis of the formation of laser interference patterns. Two, three and four-beam laser interference systems were set up to fabricate the grating, regular triangle and square structures on silicon surfaces, respectively. From the AFM micrographs, the critical features of structures have a dependence on laser fluences. For a relative low laser fluence, grating and dot structures formed with bumps due to the Marangoni Effect. With the increase of laser fluences, melt and evaporation behaviors can be responsible for the laser modification. By properly selecting the process parameters, well-defined grating and dot structures can been achieved. It can be demonstrated that direct laser interference lithography is a facile and efficient technology with the advantage of a single process procedure over macroscale areas for the fabrication of micro and nano structures.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apsusc.2013.05.042

Additional details

Identifiers

DOI
10.1016/j.apsusc.2013.05.042;
PII
S0169-4332(13)00969-0;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
282
Journal Page Range
p. 67-72
ISSN
0169-4332
CODEN
ASUSEE

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
46003493
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
ATOMIC FORCE MICROSCOPY; EVAPORATION; INTERFERENCE; LASER RADIATION; MODIFICATIONS; NANOSTRUCTURES; PERIODICITY; SILICON; SURFACES
Descriptors DEC
ELECTROMAGNETIC RADIATION; ELEMENTS; MICROSCOPY; PHASE TRANSFORMATIONS; RADIATIONS; SEMIMETALS; VARIATIONS

Optional Information

Copyright
Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.