Direct modification of silicon surface by nanosecond laser interference lithography
Creators
- 1. JR3CN and IRAC (University of Bedfordshire), Luton LU1 3JU (United Kingdom)
- 2. JR3CN and CNM (Changchun University of Science and Technology), Changchun 130022 (China)
Description
Periodic and quasi-periodic structures on silicon surface have numerous significant applications in photoelectronics and surface engineering. A number of technologies have been developed to fabricate the structures in various research fields. In this work, we take the strategy of direct nanosecond laser interference lithography technology, and focus on the silicon material to create different well-defined surface structures based on theoretical analysis of the formation of laser interference patterns. Two, three and four-beam laser interference systems were set up to fabricate the grating, regular triangle and square structures on silicon surfaces, respectively. From the AFM micrographs, the critical features of structures have a dependence on laser fluences. For a relative low laser fluence, grating and dot structures formed with bumps due to the Marangoni Effect. With the increase of laser fluences, melt and evaporation behaviors can be responsible for the laser modification. By properly selecting the process parameters, well-defined grating and dot structures can been achieved. It can be demonstrated that direct laser interference lithography is a facile and efficient technology with the advantage of a single process procedure over macroscale areas for the fabrication of micro and nano structures.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2013.05.042Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2013.05.042;
- PII
- S0169-4332(13)00969-0;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 282
- Journal Page Range
- p. 67-72
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46003493
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; EVAPORATION; INTERFERENCE; LASER RADIATION; MODIFICATIONS; NANOSTRUCTURES; PERIODICITY; SILICON; SURFACES
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; ELEMENTS; MICROSCOPY; PHASE TRANSFORMATIONS; RADIATIONS; SEMIMETALS; VARIATIONS
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.