Current Relaxation in TlGa1 – xDyxSe2 (x = 0.01, 0.03) Single Crystals
- 1. Institute of Physics, Azerbaijan National Academy of Sciences (Azerbaijan)
- 2. Nagiev Institute of Catalysis and Inorganic Chemistry, Azerbaijan National Academy of Sciences (Azerbaijan)
Description
The low-temperature relaxation processes in TlGa1 – xDyxSe2 (x = 0.01, 0.03) single crystals have been studied experimentally. The physical parameters which characterize the electron processes in Ag–TlGa1 – xDyxSe2–Ag samples have been determined using the estafette transfer mechanism of the charge formed at deep traps due to the carrier injection from a contact: the effective mobility of the charge transferred due to deep centers, the sample contact capacity, the region of accumulation of the charge in the samples, the contact charging constant, and the flight time of charge carriers through the sample.
Additional details
Identifiers
Publishing Information
- Journal Title
- Physics of the Solid State
- Journal Volume
- 62
- Journal Issue
- 7
- Journal Page Range
- p. 1150-1155
- ISSN
- 1063-7834
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 55085712
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CARRIER DENSITY; CARRIER MOBILITY; CHARGE CARRIERS; CHARGE EXCHANGE; CURRENTS; ELECTRIC CHARGES; ELECTRIC CURRENTS; ELECTRON MOBILITY; ELECTRON TRANSFER; ELECTRONS; INJECTION; MONOCRYSTALS; RELAXATION; SILVER; TIME-OF-FLIGHT METHOD; TRAPPING
- Descriptors DEC
- CRYSTALS; CURRENTS; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; INTAKE; LEPTONS; METALS; MOBILITY; PARTICLE MOBILITY; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2020 © Pleiades Publishing, Ltd. 2020