Predominant point defects in tellurium saturated CdTe

High temperature Hall effect measurements at 570-1070 K under well defined Te vapor pressure in CdTe single crystals grown by THM and Bridgman techniques were made. Both the free carrier density versus Te vapour pressure value and temperature dependencies were studied. At heating up till ∝870 K the hole density was Te vapor pressure independent, but it varied in different samples from 1 x 1016 to 1 x 1017 cm-3. At higher temperatures the conductivity becomes of intrinsic type, turning then into n-type one. A theoretical analysis of native point defects contents at different conditions in the framework of Kroegers quasichemical formalism was performed. It resulted in the impossibility of mutual compensation of native donors and acceptors proposed by different authors. The results were explained assuming the presence of an electrically active foreign point defect - the oxygen interstitial acceptor. (copyright 2006 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim) (orig.)