Published May 2006 | Version v1
Journal article Metadata-only

Analysis of atomic arrangement in magnetic Fe-Pt nanoparticles

Creators

  • 1. Department of Electrical and Electronic Engineering, Utsunomiya University, Utsunomiya 321-8585 (Japan)
  • 2. Materials and Structures Laboratory, Tokyo Institute of Technology, Yokohama 226-8503 (Japan)
  • 3. Department of Innovative and Engineered Materials, Tokyo Institute of Technology, Yokohama 226-8502 (Japan)

Description

The order parameter S of Fe-Pt nanoparticles is estimated from X-ray diffraction (XRD) patterns. The total intensity of a diffraction peak is obtained by Rietveld analysis as well as simply integrating the intensity. The Rietveld analysis is found to provide a plausible value of S even for a sample showing an XRD pattern with broad and overlapped peaks. Another order parameter Q, which is obtained from Moessbauer spectra, is introduced, and it is confirmed that Q is equivalent to the probability of Fe atoms being in the L1 -type atomic arrangement. The coercivity of Fe-Pt nanoparticles is directly proportional to Q, while it vanishes at S=0.4, indicating that the magnetic property of Fe-Pt nanoparticles has a closer relationship to Q than S

Additional details

Identifiers

DOI
10.1016/j.jmmm.2005.05.016;
PII
S0304-8853(05)00536-6;

Publishing Information

Journal Title
Journal of Magnetism and Magnetic Materials
Journal Volume
300
Journal Issue
2
Journal Page Range
p. 284-292
ISSN
0304-8853
CODEN
JMMMDC

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37106485
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
COERCIVE FORCE; IRON ALLOYS; MAGNETIC PROPERTIES; MOESSBAUER EFFECT; NANOSTRUCTURES; ORDER PARAMETERS; PARTICLES; PLATINUM ALLOYS; X-RAY DIFFRACTION
Descriptors DEC
ALLOYS; COHERENT SCATTERING; DIFFRACTION; DIMENSIONLESS NUMBERS; PHYSICAL PROPERTIES; PLATINUM METAL ALLOYS; SCATTERING; TRANSITION ELEMENT ALLOYS

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.