Published October 2004 | Version v1
Journal article

Least-squares fit analysis program for the evaluation of spatially resolved x-ray spectra from tokamak plasmas

  • 1. Stanford University, Stanford, California 94305 (United States)
  • 2. Princeton University, Princeton, New Jersey 08543 (United States)

Description

A least-squares fit analysis program is being developed for the study of spatially resolved x-ray spectra from tokamak plasmas. The program, written in interactive data language, can handle analysis of spectra from multiple sightlines through the plasma and compare the experimental data with a least-square fit of synthetic spectra, which are constructed from atomic modeling codes. The input parameters such as shot numbers, time groups, spatial range, spectral lines to fit and fitting parameters can be entered interactively through a graphical user interface or automatically via a script. The output consists of graphical presentations of the obtained spectral fits and fit parameter profiles as a function of time, including ion and electron temperature profiles, which are of particular interest. Output can also be sent to any open database connectivity compliant database. The features of the program are demonstrated with the analysis of the spectra of helium-like ArXVII, which were obtained with a new x-ray imaging crystal spectrometer

Additional details

Identifiers

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
75
Journal Issue
10
Journal Page Range
p. 3756-3758
ISSN
0034-6748
CODEN
RSINAK

Conference

Title
15. topical conference on high temperature plasma diagnostics
Dates
19-22 Apr 2004
Place
San Diego, CA (United States)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
36080075
Subject category
S70: PLASMA PHYSICS AND FUSION TECHNOLOGY; S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CRYSTALS; ELECTRON TEMPERATURE; HELIUM; ION TEMPERATURE; PLASMA CONFINEMENT; PLASMA DIAGNOSTICS; SPECTROMETERS; TIME DEPENDENCE; TOKAMAK DEVICES; X-RAY SPECTRA
Descriptors DEC
CLOSED PLASMA DEVICES; CONFINEMENT; ELEMENTS; FLUIDS; GASES; MEASURING INSTRUMENTS; NONMETALS; RARE GASES; SPECTRA; THERMONUCLEAR DEVICES

Optional Information

Notes
(c) 2004 American Institute of Physics