Published July 21, 2001
| Version v1
Journal article
Spatial characterization of monolithic multi-element Silicon-Drift-Detectors for X-ray spectroscopic applications
Description
Spatially resolved spectroscopic measurements with a 10 and 20 μm pencil beam have been performed on a monolithic 7-element Silicon-Drift-Detector (SDD). Detailed studies are shown of the modification of the spectroscopic response at pixel edges and pixel centre. The results give quantitative insight into the local SDD performance. A simple model predicts global properties (e.g. peak-to-background ratio) of larger SDD arrays, like the 61-element detector currently under development
Additional details
Identifiers
- PII
- S0168900201005861;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 467-468
- Journal Issue
- 1
- Journal Page Range
- p. 1163-1166
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Germany
- INIS RN
- 34013977
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- INTEGRATED CIRCUITS; POSITION SENSITIVE DETECTORS; SI SEMICONDUCTOR DETECTORS; SIGNAL-TO-NOISE RATIO; SPECTRAL RESPONSE; X-RAY DETECTION; X-RAY SPECTROSCOPY
- Descriptors DEC
- DETECTION; ELECTRONIC CIRCUITS; MEASURING INSTRUMENTS; MICROELECTRONIC CIRCUITS; RADIATION DETECTION; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2001 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.