Published November 30, 2011 | Version v1
Journal article

Bending of silicon plate crystals through superficial grooving: Modeling and experimentation

Description

Permanent and reproducible deformation of silicon mono-crystals has been experimentally attained by mechanical grooving of one of its surfaces. The method produces uniform deformation that can be controlled by proper choice of the parameters of grooving. The strain in silicon plates was modeled analytically in terms of a superficial compression occurring in the material between the grooves. The superficial grooved region acts as if it were like a tensile film with the strain propagating deep into the bulk, which results in spherical and homogeneous curvature of the whole crystal plate. Thereby, the classic Stoney's formula was reconsidered and adapted for explanation of the experimental behavior. Minimum radius of curvature experimentally achieved was about 3 m. Curved crystals are the basis for many applications, e.g. for x-ray optics to manipulate high energy photons for the construction of very sensitive instruments for x-ray astronomy.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2011.09.005

Additional details

Identifiers

DOI
10.1016/j.tsf.2011.09.005;
PII
S0040-6090(11)01618-X;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
520
Journal Issue
3
Journal Page Range
p. 1069-1073
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
7. international workshop on semiconductor gas sensors
Dates
12-16 Sep 2010
Place
Krakow (Poland)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43108539
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BENDING; CRYSTALS; FILMS; MECHANICAL PROPERTIES; SILICON; SIMULATION; STRAINS; SURFACES; X RADIATION
Descriptors DEC
DEFORMATION; ELECTROMAGNETIC RADIATION; ELEMENTS; IONIZING RADIATIONS; RADIATIONS; SEMIMETALS

Optional Information

Copyright
Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.