Published July 24, 1985 | Version v1
Patent Metadata-only

X-ray diffractometer

Creators

Description

The invention has been aimed at the characterization of solid-state structures and is applicable to X-ray diffractometers. It ensures a reduction of expenditure, an improved qualitative phase-shift analysis and a registration of defects inaccessible by software. The X-ray diffractometer has a recorder for the graphic diffraction pattern representation and a sensor for setting the angular marks as well as a device for the stepwise acquisition and numerical processing of intensity values. In the case of switching the X-ray diffractometer to the step-by-step procedure the recorder is switched on in one operation and coupled with the angular mark sensor

Availability note (English)

Available from BUCHEXPORT, DDR-7010 Leipzig.

Additional details

Additional titles

Original title (German)
Roentgendiffraktometer

Publishing Information

Imprint Pagination
vp.
IPC:
Int. Cl. G01n 23/20.
IPC
Int. Cl. G01n 23/20.
Patent number
DD patent document 225219/A/

INIS

Country of Publication
German Democratic Republic
Country of Input or Organization
German Democratic Republic
INIS RN
17028708
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Non-conventional Literature
Descriptors DEI
ANGULAR DISTRIBUTION; CRYSTAL STRUCTURE; DIAGRAMS; DIFFRACTION METHODS; PHASE STUDIES; PLOTTERS; RECORDING SYSTEMS; SOLIDS; X-RAY DIFFRACTOMETERS
Descriptors DEC
COMPUTER-GRAPHICS DEVICES; DIFFRACTOMETERS; DISTRIBUTION; INFORMATION; MEASURING INSTRUMENTS