Published July 1995 | Version v1
Report Metadata-only

Rate and lifetime characteristics of a gas microstrip detector fabricated on sputtered S8900 glass

Creators

  • 1. Valtion Teknillinen Tutkimuskeskus, Espoo (Finland)

Description

The rate and aging characteristics of a gas microstrip detector fabricated on a thin film (800nm) of semiconducting glass (S8900) supported on a 1.1mm substrate of barium-alumina-borosilicate glass (Corning 7059) are reported. (author)

Availability note (English)

Available from Rutherford Appleton Laboratory, Chilton. OX11 0QX.

Additional details

Publishing Information

Imprint Pagination
7 p.
Report number
RAL-TR--95-032

INIS

Country of Publication
United Kingdom
Country of Input or Organization
United Kingdom
INIS RN
27015923
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Numerical Data, Non-conventional Literature
Descriptors DEI
BOROSILICATE GLASS; DEPOSITION; EXPERIMENTAL DATA; FABRICATION; LIFETIME; SEMICONDUCTOR DETECTORS; SPUTTERING; SUBSTRATES; THIN FILMS
Descriptors DEC
DATA; FILMS; GLASS; INFORMATION; MEASURING INSTRUMENTS; NUMERICAL DATA; RADIATION DETECTORS