Published June 1, 2011 | Version v1
Journal article

Effect of PbZr0.52Ti0.48O3 thin layer on structure, electronic and magnetic properties of La0.65Sr0.35 MnO3 and La0.65Ca0.30MnO3 thin-films

  • 1. Department of Physics, Brock University, St. Catharines, Ontario, Canada, L2S 3A1 (Canada)
  • 2. Max-Planck-Institut fuer Festkoerperforschung, Heisenbergstrasse 1, D70506 Stuttgart (Germany)
  • 3. Laboratoire CRISMAT, ENSICAEN, Universite de Caen, CNRS, 6 Bd Marechal Juin, F-14050 Caen 4 (France)
  • 4. EMAT, Universiteit Antwerpen (RUCA), B 2020 Antwerpen (Belgium)

Description

Epitaxial thin film heterostructures of high dielectric PbZr1-xTixO3 (PZT) and La1-xAxMnO3 (A-divalent alkaline earth metals such as Sr (LSMO) and Ca (LCMO)) were grown on SrTiO3 substrates and their structure, temperature dependence of electrical resistivity, and magnetization were investigated as a function of the thickness of the LSMO(LCMO) layer. The microstructures of the samples were analyzed by TEM. By applying an electric field across the PZT layer, we applied a ferrodistortive pressure on the manganite layer and studied the correlations between lattice distortion and electric transport and magnetic properties of the CMR materials.

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Applied Physics
Journal Volume
109
Journal Issue
11
Journal Page Range
p. 113707-113707.8
ISSN
0021-8979
CODEN
JAPIAU

Optional Information

Notes
(c) 2011 American Institute of Physics