Nano-scratching and nano-machining in different environments on Cr2N/Cu multilayer thin films
- 1. Research Center for Micro/ Nanotechnology, Tungnan University, Taiwan (China)
- 2. Institute of Mechatronic Engineering, Tungnan University, Taiwan (China)
- 3. Department of Mechanical Engineering, Tungnan University, Taiwan (China)
- 4. Center for Thin Film Technologies and Applications, Mingchi University of Technology, Taiwan (China)
- 5. Department of Materials Engineering, Mingchi University of Technology, Taiwan (China)
Description
Five nanostructured Cr2N/Cu multilayer coatings were deposited by a bipolar asymmetric reactive pulsed DC magnetron sputtering system, and various bilayer periods (Λ) were achieved by controlling the holding time of Si substrates in the plasma of Cr or Cu. The hardness and elastic modulus of multilayer coatings were investigated by means of a nanoindenter. Nano-scratch and nano machining experiments on multilayered coatings were conducted using atomic force microscopy (AFM) in air and DI-water, respectively. According to the groove depth, width, and coefficient of friction (COF) obtained from nano-scratch tests, influences of scratch cycle numbers and bilayer periods on the scratchability of Cr2N/Cu multilayered thin films were examined. It was observed that after nano-scratch experiments in air and water, the COF values and the amount of removed material increased with increasing bilayer period. After nano-machining tests in air and water, different types of the cutting chip pile-ups were observed. In this work, the surface tribological properties and machinability of Cr2N/Cu multilayered thin films when using an AFM are discussed.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2011.01.067Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2011.01.067;
- PII
- S0040-6090(11)00079-4;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 519
- Journal Issue
- 15
- Journal Page Range
- p. 4992-4996
- ISSN
- 0040-6090
- CODEN
- THSFAP
Conference
- Title
- 5. international conference on technological advances of thin films and coatings
- Acronym
- Thin Films 2010
- Dates
- 12-14 Jul 2010
- Place
- Harbin (China)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43050264
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AIR; ATOMIC FORCE MICROSCOPY; CHROMIUM NITRIDES; COATINGS; HARDNESS; LAYERS; MAGNETRONS; NANOSTRUCTURES; PLASMA; SPUTTERING; SUBSTRATES; THIN FILMS; WATER
- Descriptors DEC
- CHROMIUM COMPOUNDS; ELECTRON TUBES; ELECTRONIC EQUIPMENT; EQUIPMENT; FILMS; FLUIDS; GASES; HYDROGEN COMPOUNDS; MECHANICAL PROPERTIES; MICROSCOPY; MICROWAVE EQUIPMENT; MICROWAVE TUBES; NITRIDES; NITROGEN COMPOUNDS; OXYGEN COMPOUNDS; PNICTIDES; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.