Published April 1, 2011 | Version v1
Journal article

Growth and interface phase stability of barium hexaferrite films on SiC(0001)

  • 1. York JEOL Nanoscience Centre, Heslington, York YO10 5DD (United Kingdom)
  • 2. Department of Physics, University of York, Heslington, York YO10 5DD (United Kingdom)
  • 3. Chemical Engineering Department, Northeastern University, Boston, Massachusetts 02115 (United States)

Description

We have studied interface phase stability of the BaFe12O19 (BaM) thin films grown by molecular beam epitaxy on SiC(0001). The films were epitaxially grown with the following crystallographic relation: BaM(0001) parallel SiC(0001) and BaM(11-20) parallel SiC(11-20). High resolution TEM reveals the existence of two interfacial bands with different structure than BaM. The first band close to SiC is SiOx while the second has spinel structure and chemically corresponds to Fe3O4. These findings suggest that at initial growth stages Fe3O4 is more favorable than BaM. Density functional theory modeling of the phase stability of BaM compared to Fe3O4 shows that BaM is only stable at high oxygen partial pressures.

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Applied Physics
Journal Volume
109
Journal Issue
7
Journal Page Range
p. 07E520-07E520.3
ISSN
0021-8979
CODEN
JAPIAU

Conference

Title
55. annual conference on magnetism and magnetic materials
Dates
14-18 Nov 2010
Place
Atlanta, GA (United States)

Optional Information

Notes
(c) 2011 American Institute of Physics