Published October 1, 2019 | Version v1
Journal article

Automatic Deformation Measurement Equipment for PZT Wafer

  • 1. Key Laboratory for Precision & Non-traditional Machining of the Ministry of Education, Dalian University of Technology, Dalian (China)
  • 2. Key Laboratory for Micro/Nano Technology and System of Liaoning Province, Dalian University of Technology, Dalian (China)

Description

PZT wafers are the core driving parts to adjust the laser resonant cavity length of laser gyro. Usually, the PZT wafers are used in pairs, and the paired PZT wafers need to have close piezoelectric coefficient. To handle the pairing and screening of PZT wafers, an automatic deformation measuring equipment is developed by using a cartesian-coordinate robot frame, in which multiple photoelectric sensors are used to detect the key motion position automatically. Besides, vacuum absorption technology is also used in picking, carrying and placing PZT wafers to protect them from accidental injury. When driving voltage is applied to PZT wafer, the resulting micro displacement is measured by dual opposite inductive probes with relative measurement principle. This measuring strategy eliminates the influence of placement error of PZT wafers on the final measuring result. Compared with the existing manual measurement, the efficiency can be improved by 60%. The experimental results show that the equipment has high reliability and consistency. The measurement accuracy in full scale is no more than 0.5 μm and the repeat accuracy is superior to 0.1 μm. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1757-899X/627/1/012022

Additional details

Publishing Information

Journal Title
IOP Conference Series. Materials Science and Engineering (Online)
Journal Volume
627
Journal Issue
1
Journal Page Range
[6 p.]
ISSN
1757-899X

Conference

Title
4. International Conference on Design and Manufacturing Engineering
Dates
15-17 Jul 2019
Place
Geelong (Australia)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
53003227
Subject category
S42: ENGINEERING; S47: OTHER INSTRUMENTATION;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ABSORPTION; ACCURACY; CARTESIAN COORDINATES; EFFICIENCY; ELECTRIC POTENTIAL; ERRORS; LASERS; PIEZOELECTRICITY; PZT; RELIABILITY; ROBOTS; SENSORS
Descriptors DEC
COORDINATES; ELECTRICITY; EQUIPMENT; LEAD COMPOUNDS; OXYGEN COMPOUNDS; SORPTION; TITANATES; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; ZIRCONATES; ZIRCONIUM COMPOUNDS