Numerical simulation of highly sensitive GaO pressure sensor
- 1. Faculty of Electrical & Electronics Engineering, Duy Tan University (DTU), Da Nang, 550000 (Viet Nam)
- 2. School of Mechanical Engineering, Ulsan National Institute of Science and Technology (UNIST), Ulsan, 44919 (Korea, Republic of)
- 3. Power Device Works, Mitsubishi Electric Corporation, Kumamoto, 861-1197 (Japan)
Description
This article presents beta-gallium oxide (β-GaO) micro electro mechanical systems (MEMS) strain/pressure sensors as a way to enhance sensitivity. The model consists of four piezoresistive strain gauges connected in a Wheatstone bridge configuration. The MEMS model is simulated from 0 Pa to 50 kPa, resulting in an output signal range of -3-16 mV and a responsivity of 0.38 mV kPa. The simulation also shows that as temperature increases, the resistance of the piezoresistive material in the MEMS decreases, leading to changes in the output signals. The reliable device effectively utilizes the full Wheatstone bridge configuration to compensate for temperature-related influences. These early results suggest that GaO-based MEMS devices have great potential for use in high-temperature pressure sensor applications in the future. (© 2023 Wiley‐VCH GmbH)
Additional details
Identifiers
Publishing Information
- Journal Title
- Physica Status Solidi. A, Applications and Materials Science (Online)
- Journal Volume
- 221
- Journal Issue
- 3
- Journal Page Range
- p. 1-7
- ISSN
- 1862-6319
- CODEN
- PSSABA
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 55034923
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- COMPUTERIZED SIMULATION; CONFIGURATION; ELECTRIC CONDUCTIVITY; FINITE ELEMENT METHOD; GALLIUM OXIDES; MEMS; PIEZOELECTRICITY; PRESSURE MEASUREMENT; SENSITIVITY; SENSORS; STRAIN GAGES; STRAINS; YOUNG MODULUS
- Descriptors DEC
- CALCULATION METHODS; CHALCOGENIDES; ELECTRICAL PROPERTIES; ELECTRICITY; GALLIUM COMPOUNDS; MATHEMATICAL SOLUTIONS; MEASURING INSTRUMENTS; MECHANICAL PROPERTIES; NUMERICAL SOLUTION; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SIMULATION
Optional Information
- Notes
- AID: 2300534