Published October 1978 | Version v1
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A method for studying activity profiles in surface layers

Creators

Description

A method is described for obtaining an activity profile for oxidized steel specimens in which the surface layers are eroded by sputtering with a beam of argon ions. The sputtered material is collected on metal plates for subsequent activity measurement. The method has been shown to produce sputtering rates of around 1μg mC-1, corresponding to thinning rates of about 1μm h-1. The sputtered material could be collected with 25 to 50% geometrical efficiency. The depth resolution was about 20 nm. (author)

Availability note (English)

MF available from INIS under the Report Number.

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Additional details

Publishing Information

Imprint Pagination
9 p.
Report number
CEGB-RD/B/N--4415

INIS

Country of Publication
United Kingdom
Country of Input or Organization
United Kingdom
INIS RN
10463747
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
ARGON IONS; ARGON 40 BEAMS; IRON; MEASURING METHODS; OXIDATION; RADIOACTIVITY; REACTOR COMPONENTS; SPUTTERING; STEELS; SURFACE CONTAMINATION
Descriptors DEC
ALLOYS; BEAMS; CARBON ADDITIONS; CHARGED PARTICLES; CHEMICAL REACTIONS; CONTAMINATION; ELEMENTS; ION BEAMS; IONS; IRON ALLOYS; IRON BASE ALLOYS; METALS; TRANSITION ELEMENT ALLOYS; TRANSITION ELEMENTS