Low-energy x-ray dosimetry studies (6 to 16 keV) at SSRL beamline 1-5

Synchrotron radiation facilities provide a unique opportunity for low-energy x-ray dosimetry studies because of the availability of monochromatic x-ray beams. Results of such studies performed at the Stanford Synchrotron Radiation Laboratory (SSRL) are described. Polish lithium fluoride thermoluminescent dosemeters (TLDs), MTS-N(LiF:Mg, Ti- 0.4 mm thick), MCP-N (LiF:Mg, Cu, P - 0.4 mm thick) were exposed free in air to monochromatic x-rays (6-16 keV). These exposures were monitored with an SSRL ionization chamber. The responses (counts/Gy) of MTS-N and MCP-N were generally found to increase with increasing energy. The response at 16 keV is about 3 and 4 times higher than the response at 6 keV for MTS-N and MCP-N, respectively. Irradiation at 6 keV indicates a fairly linear dose response for both type of TLDs over a dose range of 0.01 to 0.4 Gy. In addition there appears to be no significant difference in responses between irradiating the TLDs from the front and the back sides. The energy response of the PTW ionization chamber type 23342 relative to the SSRL ionization chamber is within ±4.5% between 6 and 16 keV. Both the TLDs and the PTW ionization chamber can also be used for beam dosimetry