Published February 5, 2014 | Version v1
Journal article

Determination of energy levels at the interface between O2 plasma treated ITO/P3HT : PCBM and PEDOT : PSS/P3HT : PCBM using angular-resolved x-ray and ultraviolet photoelectron spectroscopy

  • 1. Low Dimensional Materials Research Centre, Department of Physics, University of Malaya, Malaysia, 50603 (Malaysia)
  • 2. Synchrotron Light Research Institute, 111 University Avenue, Muang District, Nakhon Ratchasima 30000 (Thailand)
  • 3. NANOTEC-SUT Center of Excellence on Advanced Functional Nanomaterials and School of Physics, Suranaree University of Technology, Nakhon Ratchasima 30000 (Thailand)

Description

Interfacial energy alignments at the anode of solution processable organic photovoltaics are rarely studied. Here we use blended regio-regular poly(3-hexylthiophene) (P3HT) : phenyl-C61-butyric acid methyl ester (PCBM) deposited on top of O2 plasma cleaned indium tin oxide (ITO) and poly(3,4-ethylene-dioxythiophene) : polystyrene sulfonic acid (PEDOT : PSS) as a platform to obtain the interfacial energy alignment using angular-resolved x-ray and ultraviolet photoelectron spectroscopy. A strong downward vacuum level bending of 1.3 eV at the interface for plasma-ITO/P3HT : PCBM is observed. This results in an interfacial energetic barrier as high as 2.5 eV for holes and a reduction of barrier for electrons. This could be one of the contributing factors that result in lower device efficiency in O2 plasma-ITO/P3HT : PCBM compared to O2 plasma-ITO/PEDOT : PSS/P3HT : PCBM. The full interfacial energy diagram is determined for O2 plasma-ITO/P3HT : PCBM and PEDOT : PSS/P3HT : PCBM. Such methods can be extended to study various interfacial properties of solution processable organic semiconducting materials. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/0022-3727/47/5/055109

Additional details

Publishing Information

Journal Title
Journal of Physics. D, Applied Physics
Journal Volume
47
Journal Issue
5
Journal Page Range
[8 p.]
ISSN
0022-3727
CODEN
JPAPBE