Published April 2010 | Version v1
Journal article

Long-range correlations in In2O3(ZnO)7 investigated by DFT calculations and electron holography

  • 1. Triebenberg Laboratory, Institute for Structure Physics, Technische Universitaet Dresden, D-01602 Dresden (Germany)
  • 2. Institute of Physical and Theoretical Chemistry, University of Bonn, Wegelerstr. 12, D-53115 Bonn (Germany)
  • 3. Institute of Inorganic Chemistry, University of Bonn, Roemerstr. 164, D-53117 Bonn (Germany)

Description

The system In2O3(ZnO)7 exhibits a strained ZnO-like domain structure intersected by indium containing, parallely arranged defect planes with a regular spacing of about 2.4 nm. We propose that the strain within the domains originates from long-range electric fields due to charge localization at the defects inducing ionic displacements. The origin of the electric fields has been investigated theoretically by means of density functional theory (DFT). Calculated electric fields were incorporated as scattering potentials in holographic imaging simulations. Since the exact structure of the system is unknown, a novel structure model was derived for In2O3(ZnO)7 from known members of the homologous series of In2O3(ZnO)m with m=3,5 and refined by structure optimization at DFT level. The theoretical results are compared to experimental findings in high-resolution phase images obtained by means of electron holography, which suggest residual intrinsic electric fields. A careful consideration of noise levels and the influence of the microscope, however, show that the electric field signal is at the detection limit of state-of-the-art high-resolution electron holography.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.ultramic.2009.10.005

Additional details

Identifiers

DOI
10.1016/j.ultramic.2009.10.005;
PII
S0304-3991(09)00222-8;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
110
Journal Issue
5
Journal Page Range
p. 400-410
ISSN
0304-3991
CODEN
ULTRD6

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.