Published December 14, 1990
| Version v1
Journal article
Monte Carlo calculation of the contribution of backscattered electrons to secondary electron emission from aluminium
- 1. Royal Melbourne Inst. of Tech. (Australia)
- 2. Commonwealth Scientific and Industrial Research Organization, Clayton (Australia). Div. of Materials Science and Technology
Description
A Monte Carlo model for the simulation of electron penetration into aluminium and for the generation and emission of secondary electrons is presented. Monte Carlo calculations for the penetration and backscattering of primary electrons show good agreement with experiment, while the dependence of the secondary electron yield on the primary electron energy show qualitative agreement with experimental measurements. β, which is defined as the relative efficiency of backscattered electrons for producing secondary electrons which escape the surface over that of the primary electrons on their inward path, is found to be ∼6-7 for primary electrons in the energy range 3-25 keV. (author)
Additional details
Publishing Information
- Journal Title
- Journal of Physics. D, Applied Physics
- Journal Volume
- 23
- Journal Issue
- 12
- Series
- J. Phys., D Appl. Phys.
- Journal Page Range
- 1738-1743
- ISSN
- 0022-3727
- CODEN
- JPAPB
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- United Kingdom
- INIS RN
- 22029973
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ALUMINIUM 27 TARGET; BACKSCATTERING; ELECTRON EMISSION; ELECTRON-ATOM COLLISIONS; KEV RANGE 01-10; KEV RANGE 10-100; MONTE CARLO METHOD; SIMULATION
- Descriptors DEC
- ATOM COLLISIONS; COLLISIONS; ELECTRON COLLISIONS; EMISSION; ENERGY RANGE; KEV RANGE; SCATTERING; TARGETS