Published February 2009 | Version v1
Journal article Metadata-only

The quantitative evaluation of PIXE analysis

Creators

  • 1. Hosei Univ., College of Engineering and Research Center of Ion Beam Technology, Koganei, Tokyo (Japan)

Description

no abstract available

Additional details

Publishing Information

Journal Title
Hosei Daigaku Ion Bimu Kogaku Kenkyusho Hokoku
Journal Issue
no.28
Journal Page Range
p. 14-16
ISSN
0286-0201

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
41098452
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Resource subtype / Literary indicator
No Abstract
Descriptors DEI
CALIBRATION STANDARDS; CHEMICAL REACTION YIELD; ELECTRON EMISSION; ELEMENTS; ION BEAMS; IRRADIATION; PIXE ANALYSIS; QUANTITATIVE CHEMICAL ANALYSIS; ROCKS; SECONDARY EMISSION
Descriptors DEC
BEAMS; CHEMICAL ANALYSIS; EMISSION; NONDESTRUCTIVE ANALYSIS; STANDARDS; X-RAY EMISSION ANALYSIS; YIELDS

Optional Information

Notes
8 refs., 1 fig., 1 tab.