Published February 1, 2019
| Version v1
Journal article
Effect of SnO2 substitution on microwave dielectric characteristics of Zn0.15Nb0.3Ti0.55O2 ceramics
- 1. National Engineering Research Center of Electromagnetic Radiation Control Materials, University of Electronic Science and Technology of China, Chengdu, 610054 (China)
Description
Abstract The relevance of Sn4+ substituted for Ti4+ of Zn0.15Nb0.3Ti0.55O2 ceramics is investigated. X-ray diffraction patterns indicate that the major phase can be matched with Zn0.15Nb0.3Ti0.55O2 and a second phase ZnTiNb2O8 appears in different composition. The content of ZnTiNb2O8 phase gradually increases along with more substitution, which is contributed to the decline of ϵr. The decrease of grain size and the observed pores have negative influence on Q × f values. And the τf values move towards a lower value, corresponding to the variation of ϵr. An optimal combination of microwave dielectric properties is: ϵr = 83.2, Q × f = 15456 GHz, τ f = 301.5 ppmfC with x = 0.03, sintered at 1050 "C. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1757-899X/479/1/012032Additional details
Identifiers
Publishing Information
- Journal Title
- IOP Conference Series. Materials Science and Engineering (Online)
- Journal Volume
- 479
- Journal Issue
- 1
- Journal Page Range
- [6 p.]
- ISSN
- 1757-899X
Conference
- Title
- 3. International Conference on New Material and Chemical Industry
- Dates
- 17-19 Nov 2018
- Place
- Sanya (China)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52109358
- Subject category
- S36: MATERIALS SCIENCE; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CERAMICS; DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES; GHZ RANGE; GRAIN SIZE; MICROWAVE RADIATION; TIN IONS; TIN OXIDES; TITANIUM IONS; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; CHARGED PARTICLES; COHERENT SCATTERING; DIFFRACTION; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; FREQUENCY RANGE; IONS; MATERIALS; MICROSTRUCTURE; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RADIATIONS; SCATTERING; SIZE; TIN COMPOUNDS