Published December 1, 2014 | Version v1
Journal article

An improved multi-exposure approach for high quality holographic femtosecond laser patterning

  • 1. Department of Precision Machinery and Precision Instrumentation, University of Science and Technology of China, Hefei 230026 (China)

Description

High efficiency two photon polymerization through single exposure via spatial light modulator (SLM) has been used to decrease the fabrication time and rapidly realize various micro/nanostructures, but the surface quality remains a big problem due to the speckle noise of optical intensity distribution at the defocused plane. Here, a multi-exposure approach which used tens of computer generate holograms successively loaded on SLM is presented to significantly improve the optical uniformity without losing efficiency. By applying multi-exposure, we found that the uniformity at the defocused plane was increased from ∼0.02 to ∼0.6 according to our simulation. The fabricated two series of letters "HELLO" and "USTC" under single-and multi-exposure in our experiment also verified that the surface quality was greatly improved. Moreover, by this method, several kinds of beam splitters with high quality, e.g., 2 × 2, 5 × 5 Daman, and complex nonseperate 5 × 5, gratings were fabricated with both of high quality and short time (<1 min, 95% time-saving). This multi-exposure SLM-two-photon polymerization method showed the promising prospect in rapidly fabricating and integrating various binary optical devices and their systems

Additional details

Identifiers

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
105
Journal Issue
22
Journal Page Range
p. 221104-221104.4
ISSN
0003-6951
CODEN
APPLAB

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
46108138
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Descriptors DEI
BEAM OPTICS; EFFICIENCY; HOLOGRAPHY; LASERS; MICROSTRUCTURE; NANOSTRUCTURES; PHOTONS; POLYMERIZATION; SIMULATION
Descriptors DEC
BOSONS; CHEMICAL REACTIONS; ELEMENTARY PARTICLES; MASSLESS PARTICLES

Optional Information

Notes
(c) 2014 AIP Publishing LLC