Published July 15, 2005
| Version v1
Journal article
EXAFS analysis of nanocrystallization process in Fe85Zr7B6Cu2 alloys by using cumulant method
- 1. Physics Department, Faculty of Science, Zagazig University, 44519, Sharkia (Egypt)
- 2. Center for Theoretical Physics PAS, Al. Lotnikow 32/46, 02-668 Warsaw (Poland)
- 3. Institute of Physics PAS, Al. Lotnikow 32/46, 02-668 Warsaw (Poland)
Description
The cumulant method is a model-independent technique based on the expansion of extended X-ray absorption fine structure (EXAFS) amplitudes and phases as a series of cumulants of the interatomic distance distribution. Results show evidence of simple grain boundary formed as amorphous-crystal interface region around BCC Fe nanocrystals. This interface region initially growth along with the growth of the Fe nanocrystals. However, in the latter stage of nanocrystallization, additional contribution of statically disordered interface is formed in nanograin boundaries hindering the grain growth. The disordered interfacial regions can help to explain nanocrystallization phenomenon of Fe85Zr7B6Cu2 alloys
Additional details
Identifiers
- DOI
- 10.1016/j.physb.2005.03.037;
- PII
- S0921-4526(05)00652-6;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 364
- Journal Issue
- 1-4
- Journal Page Range
- p. 71-77
- ISSN
- 0921-4526
- CODEN
- PHYBE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37068195
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; AMPLITUDES; BCC LATTICES; BORON; COPPER; CRYSTALS; DISTRIBUTION; EXPANSION; FINE STRUCTURE; GRAIN BOUNDARIES; GRAIN GROWTH; INTERATOMIC DISTANCES; INTERFACES; INTERMETALLIC COMPOUNDS; IRON; NANOSTRUCTURES; X RADIATION; X-RAY SPECTROSCOPY; ZIRCONIUM
- Descriptors DEC
- ALLOYS; CRYSTAL LATTICES; CRYSTAL STRUCTURE; CUBIC LATTICES; DISTANCE; ELECTROMAGNETIC RADIATION; ELEMENTS; IONIZING RADIATIONS; METALS; MICROSTRUCTURE; RADIATIONS; SEMIMETALS; SPECTROSCOPY; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.