Published June 27, 2016
| Version v1
Journal article
Enhancement-mode operation of multilayer MoS2 transistors with a fluoropolymer gate dielectric layer
- 1. Display Materials and Components Research Center, Korea Electronics Technology Institute, Gyeonggi 463-816 (Korea, Republic of)
- 2. Multi-Functional Bio/Nano Laboratory, Kyung Hee University, Gyeonggi 446-701 (Korea, Republic of)
Description
Enhancement-mode multilayer molybdenum disulfide (MoS2) field-effect transistors (FETs), which are an immensely important component toward low-power electronics based on a two-dimensional layered semiconductor, are demonstrated using the fluoropolymer CYTOP as a gate dielectric. The fabricated devices exhibit threshold voltage (VTH) of ∼5.7 V with field-effect mobility (μFE) of up to 82.3 cm2/V s, and the characteristics are compared with the depletion-mode characteristics of MoS2 FETs with the cross-linked Poly(4-vinylphenol) gate dielectric (VTH ∼ −7.8 V). UV photoelectron spectroscopy analysis indicates that increased surface potential due to the surface dipole effect of the fluorine group influences the positive VTH shift.
Additional details
Identifiers
- DOI
- 10.1063/1.4955024;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 108
- Journal Issue
- 26
- Journal Page Range
- vp.
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48035211
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- DIELECTRIC MATERIALS; DIPOLES; ELECTRIC POTENTIAL; EQUIPMENT; FIELD EFFECT TRANSISTORS; FLUORINE; LAYERS; MOLYBDENUM SULFIDES; OPERATION; PHOTOELECTRON SPECTROSCOPY; SEMICONDUCTOR MATERIALS; SURFACE POTENTIAL; SURFACES; TWO-DIMENSIONAL SYSTEMS
- Descriptors DEC
- CHALCOGENIDES; CRYSTAL LATTICES; CRYSTAL STRUCTURE; ELECTRON SPECTROSCOPY; ELEMENTS; HALOGENS; MATERIALS; MOLYBDENUM COMPOUNDS; MULTIPOLES; NONMETALS; POTENTIALS; REFRACTORY METAL COMPOUNDS; SEMICONDUCTOR DEVICES; SPECTROSCOPY; SULFIDES; SULFUR COMPOUNDS; TRANSISTORS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Notes
- (c) 2016 Author(s)