Published 1972
| Version v1
Journal article
Use of an emission microscope for study of dynamic processes in thyristors
Description
no abstract available
Additional details
Additional titles
- Original title (Russian)
- Применение эмиссионного электронного микроскопа для исследования динамических процессов в тиристорах
Publishing Information
- Journal Title
- Izv. Akad. Nauk SSSR, Ser. Fiz.
- Journal Volume
- 36
- Journal Issue
- 9
- Series
- Izv. Akad. Nauk SSSR, Ser. Fiz.
- Journal Page Range
- 1924-1928
Conference
- Title
- 8. All-union conference on electron microscopy; 1. All-union symposium on scanning electron microscopy.
- Dates
- 15 Nov 1971.
- Place
- Moscow, USSR.
INIS
- Country of Publication
- USSR
- Country of Input or Organization
- USSR
- INIS RN
- 4077191
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ELECTRIC FIELDS; ELECTRON EMISSION; ELECTRON MICROSCOPES; ERRORS; THYRISTORS; USES
- Descriptors DEC
- EMISSION; MICROSCOPES; SEMICONDUCTOR DEVICES
Optional Information
- Notes
- For English translation see the journal Bull. Acad. Sci. USSR, Phys. Sci.