Influence of charge changing processes on the forward to backward electron emission yield ratio for light ions impinging on thin metallic foils

Stopping power dE/dx and electron emission yield γ are known to be strongly influenced by electron capture and loss processes. In this work we consider proton impact on thin Al foils for impact velocities below two atomic units. We investigate the effect of the charge changing processes on the forward/backward electron emission yields, γF and γB as well as on the specific yields, ΛF and ΛB (Λ=γ/(dE/dx)). The dependence of the emission yields and of the specific yields as a function of the target thickness is discussed in terms of the charge changing processes