Published October 2003 | Version v1
Journal article

Spectroscopy of atomic chains with tunneling microscopy

Description

Recently, it has been possible to create metallic chains down to seven-atom long. This has two implications. Experimentally it is necessary to have algorithms that allow converting measured data into microscopic information as, for example, processing a current-voltage curve to obtain electronic density of states (DOS). From a theoretical standpoint, we have a new framework to test extant theories and to further develop them. With this in mind, we present a new theoretical solution to the problem of mapping scanning tunneling microscopy current-voltage curves into DOS-energy curves. Our model is based on a self-consistent solution to the quantum problem of electrons in the presence of an array of attractive centers. The problem, being simpler than its three-dimensional counterparts is solved exactly for DOS and for the current-voltage curves. The main results are that the current-voltage peaks at the position of the energies of the electron in the chain and, when an impurity is present in the chain, its chemical information can be extracted from the value of analytical curves

Additional details

Identifiers

DOI
10.1016/S0304-3991;
PII
S0304399103000251;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
97
Journal Issue
1-4
Journal Page Range
p. 7-17
ISSN
0304-3991
CODEN
ULTRD6

Conference

Title
4. international conference on scanning probe microscopy, sensors and nanostructures
Dates
26-29 May 2002
Place
Las Vegas, NV (United States)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37039621
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ALGORITHMS; ATOMS; CURRENTS; DIAGRAMS; ELECTRIC POTENTIAL; ELECTRONS; IMPURITIES; METALS; NANOSTRUCTURES; SCANNING TUNNELING MICROSCOPY
Descriptors DEC
ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; INFORMATION; LEPTONS; MATHEMATICAL LOGIC; MICROSCOPY

Optional Information

Copyright
Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.