Published November 1984
| Version v1
Journal article
High resolution X-ray fluorescence spectrometer and trace element analysis
- 1. Andhra Univ., Visakhapatnam (India). Labs. for Nuclear Research
Description
An energy dispersive X-ray fluorescence spectrometer (ENDXRF system) of high resolution was installed. The different parts of the system are briefly described. The initial results concerning trace element analysis in a tobacco sample, beach sands, coal sample and air participate matter are reported. (author)
Additional details
Publishing Information
- Journal Title
- Indian J. Phys., Part A
- Journal Volume
- 58
- Journal Issue
- 6
- Series
- Indian J. Phys., Part A.
- Journal Page Range
- 466-468
- ISSN
- 0252-9262
- CODEN
- INJAD
Conference
- Title
- 5. national symposium on radiation physics.
- Dates
- 21-24 Nov 1983.
- Place
- Calcutta (India).
INIS
- Country of Publication
- India
- Country of Input or Organization
- India
- INIS RN
- 18012296
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COAL; ELEMENTS; RESOLUTION; SAND; TOBACCO; TRACE AMOUNTS; X-RAY FLUORESCENCE ANALYSIS; X-RAY SPECTROMETERS
- Descriptors DEC
- CARBONACEOUS MATERIALS; CHEMICAL ANALYSIS; ENERGY SOURCES; FOSSIL FUELS; FUELS; MATERIALS; MEASURING INSTRUMENTS; NONDESTRUCTIVE ANALYSIS; SPECTROMETERS; X-RAY EMISSION ANALYSIS