Published August 1, 2015
| Version v1
Journal article
Discrimination Voltage and Overdrive Bias Dependent Performance Evaluation of Passively Quenched SiC Single-Photon-Counting Avalanche Photodiodes
- 1. Jiangsu Provincial Key Laboratory of Advanced Photonic and Electronic Materials, and School of Electronic Science and Engineering, Nanjing University, Nanjing 210093 (China)
Description
In many critical civil and emerging military applications, low-level UV detection, sometimes at single photon level, is highly desired. In this work, a mesa-type 4H-SiC UV avalanche photodiode (APD) is designed and fabricated, which exhibits low leakage current and high avalanche gain. When studied by using a passive quenching circuit, the APD exhibits self-quenching characteristics due to its high differential resistance in the avalanche region. The single photon detection efficiency and dark count rate of the APD are evaluated as functions of discrimination voltage and over-drive voltage. The optimized operation conditions of the single photon counting APD are discussed. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/0256-307X/32/8/088503Additional details
Identifiers
Publishing Information
- Journal Title
- Chinese Physics Letters
- Journal Volume
- 32
- Journal Issue
- 8
- Journal Page Range
- [4 p.]
- ISSN
- 0256-307X
- CODEN
- CPLEEU
INIS
- Country of Publication
- China
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48022601
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- COUNTING RATES; DESIGN; DETECTION; EFFICIENCY; ELECTRIC POTENTIAL; EVALUATION; GAIN; LEAKAGE CURRENT; LEAKS; OPERATION; PERFORMANCE; PHOTODIODES; PHOTONS; QUENCHING; SILICON; SILICON CARBIDES
- Descriptors DEC
- AMPLIFICATION; BOSONS; CARBIDES; CARBON COMPOUNDS; CURRENTS; ELECTRIC CURRENTS; ELEMENTARY PARTICLES; ELEMENTS; MASSLESS PARTICLES; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SEMIMETALS; SILICON COMPOUNDS