Position-resolving x-ray diffractometry

A technique is described which provides a position-resolving x-ray fine-structure analysis based on the application of image reconstruction from projections. The additions to the conventional counter tube interference goniometer required for such measurements are a scanning unit and a micro-computer. Instead of the customary counter tube it is preferable to use a position-sensitive x-ray detector. The scanning unit provides for translational and rotational motions of the specimen. The specimen is moved in step increments past an x-ray beam which is defined by a strip-shaped slit arrangement, and a deflection line is measured, recorded, and stored in the computer at each step. The diffraction line corresponding to each point of the specimen is then calculated from many such projections, recorded for various directions. The resolution attainable lies in the range of 0.1 to 1 mm. In principle there is no limitation to the size of the speciments. However, with the customary x-ray apparatus there is a limitation to between about 1 and 3 cm diameter. 24 refs., 62 figs