"Total IBA" – Where are we?
Creators
- 1. University of Surrey Ion Beam Centre, Guildford (United Kingdom)
Description
The suite of techniques which are available with the small accelerators used for MeV ion beam analysis (IBA) range from broad beams, microbeams or external beams using the various particle and photon spectrometries (including RBS, EBS, ERD, STIM, PIXE, PIGE, NRA and their variants), to tomography and secondary particle spectrometries like MeV-SIMS. These can potentially yield almost everything there is to know about the 3-D elemental composition of types of samples that have always been hard to analyse, given the sensitivity and the spacial resolution of the techniques used. Molecular and chemical information is available in principle with, respectively, MeV-SIMS and high resolution PIXE. However, these techniques separately give only partial information – the secret of "Total IBA" is to find synergies between techniques used simultaneously which efficiently give extra information. We here review how far "Total IBA" can be considered already a reality, and what further needs to be done to realise its full potential.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2011.09.020Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2011.09.020;
- PII
- S0168-583X(11)00884-6;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 271
- Journal Issue
- Complete
- Journal Page Range
- p. 107-118
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43106282
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ACCELERATORS; ION BEAMS; ION MICROPROBE ANALYSIS; MASS SPECTROSCOPY; MEV RANGE; PHOTONS; PIXE ANALYSIS; RESOLUTION; REVIEWS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SENSITIVITY; TOMOGRAPHY; X RADIATION
- Descriptors DEC
- BEAMS; BOSONS; CHEMICAL ANALYSIS; DIAGNOSTIC TECHNIQUES; DOCUMENT TYPES; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; ENERGY RANGE; IONIZING RADIATIONS; MASSLESS PARTICLES; MICROANALYSIS; NONDESTRUCTIVE ANALYSIS; RADIATIONS; SPECTROSCOPY; X-RAY EMISSION ANALYSIS
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.