Morphological, optical and electrical properties of samarium oxide thin films
- 1. INFLPR — National Institute for Laser, Plasma and Radiation Physics, PO Box MG-16, Magurele RO-077125, Bucharest (Romania)
- 2. INFM — National Institute of Materials Physics, P.O. Box MG-7, Magurele RO-077125, Bucharest (Romania)
Description
We present here results on samarium oxide thin films, obtained by pulsed laser deposition and by radio frequency assisted pulsed laser deposition. Three different substrate types were used: silicon, platinum covered silicon and titanium covered silicon. The influence of the deposition parameters (oxygen pressure and laser fluence) on the structure and morphology of the thin films was studied. The substrate-thin film interface zone was investigated; the optical and electrical properties (the losses, dielectric constant and leakage currents) were also determined. - Highlights: ► We studied Sm2O3 thin films deposited by laser and plasma-assisted technique. ► Several substrates were used: silicon, and platinum- and titanium-covered silicon. ► The substrate-thin film interface was investigated with respect to composition. ► Morphological, optical and electrical characteristics of the films were determined.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2012.06.049Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2012.06.049;
- PII
- S0040-6090(12)00759-6;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 520
- Journal Issue
- 20
- Journal Page Range
- p. 6393-6397
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44103524
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; ENERGY BEAM DEPOSITION; INTERFACES; ION MICROPROBE ANALYSIS; LASER RADIATION; LEAKAGE CURRENT; MASS SPECTROSCOPY; MORPHOLOGY; OPTICAL PROPERTIES; PERMITTIVITY; PLASMA; PLATINUM; PULSED IRRADIATION; RADIOWAVE RADIATION; SAMARIUM OXIDES; SILICON; THIN FILMS; TITANIUM
- Descriptors DEC
- CHALCOGENIDES; CHEMICAL ANALYSIS; CURRENTS; DEPOSITION; DIELECTRIC PROPERTIES; ELECTRIC CURRENTS; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; ELEMENTS; FILMS; IRRADIATION; METALS; MICROANALYSIS; MICROSCOPY; NONDESTRUCTIVE ANALYSIS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; PLATINUM METALS; RADIATIONS; RARE EARTH COMPOUNDS; SAMARIUM COMPOUNDS; SEMIMETALS; SPECTROSCOPY; SURFACE COATING; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.