Published August 1, 2012 | Version v1
Journal article

Morphological, optical and electrical properties of samarium oxide thin films

  • 1. INFLPR — National Institute for Laser, Plasma and Radiation Physics, PO Box MG-16, Magurele RO-077125, Bucharest (Romania)
  • 2. INFM — National Institute of Materials Physics, P.O. Box MG-7, Magurele RO-077125, Bucharest (Romania)

Description

We present here results on samarium oxide thin films, obtained by pulsed laser deposition and by radio frequency assisted pulsed laser deposition. Three different substrate types were used: silicon, platinum covered silicon and titanium covered silicon. The influence of the deposition parameters (oxygen pressure and laser fluence) on the structure and morphology of the thin films was studied. The substrate-thin film interface zone was investigated; the optical and electrical properties (the losses, dielectric constant and leakage currents) were also determined. - Highlights: ► We studied Sm2O3 thin films deposited by laser and plasma-assisted technique. ► Several substrates were used: silicon, and platinum- and titanium-covered silicon. ► The substrate-thin film interface was investigated with respect to composition. ► Morphological, optical and electrical characteristics of the films were determined.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2012.06.049

Additional details

Identifiers

DOI
10.1016/j.tsf.2012.06.049;
PII
S0040-6090(12)00759-6;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
520
Journal Issue
20
Journal Page Range
p. 6393-6397
ISSN
0040-6090
CODEN
THSFAP

Optional Information

Copyright
Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.