Published August 1981
| Version v1
Journal article
Fluctuation-induced conductivity of tin films
Description
The temperature dependence of the fluctuation induced excess electrical conductivity of thin (thickness much less than the coherence length) superconducting films of tin has been measured below the transition temperature. Two types of specimen have been investigated, (a) bare films (b) films covered by a protective layer of germanium. Results show that the fluctuation parameter epsilonsub(c) of the theory of Kajimura, Micoshiba and Yamaji is unaffected by Ge layer. Its value, however, is much larger than that predicted by the theory. (orig.)
Additional details
Publishing Information
- Journal Title
- Physica B plus C
- Journal Volume
- 108
- Journal Issue
- 1-3
- Series
- Physica B plus C.
- Journal Page Range
- 967-968
- ISSN
- 0378-4363
Conference
- Title
- 16. international conference on low temperature physics.
- Dates
- 19 - 25 Aug 1981.
- Place
- Los Angeles, CA, USA.
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 13672926
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- COATINGS; ELECTRIC CONDUCTIVITY; EXPERIMENTAL DATA; FILMS; FLUCTUATIONS; GERMANIUM; SUPERCONDUCTIVITY; TEMPERATURE DEPENDENCE; TIN; TRANSITION TEMPERATURE
- Descriptors DEC
- DATA; ELECTRICAL PROPERTIES; ELEMENTS; INFORMATION; METALS; NUMERICAL DATA; PHYSICAL PROPERTIES; THERMODYNAMIC PROPERTIES; VARIATIONS