Deconvolution of 3d transition metal L-edge EXAFS and magnetic EXAFS signals
- 1. Naval Research Laboratory, Code 6685 Code 6345, Washington, DC 20375 (United States)
Description
Due to the closely overlapping L-edge EXAFS regions for the ferromagnetic 3d metals, their analyses have not generally been attempted. Similarly, although analysis of L-edge magnetic EXAFS (MEXAFS) is desirable because of the enhanced amplitude of the signal compared to K-edge MEXAFS, such experiments on the ferromagnetic 3d metals have also not been attempted. In order to address this problem, we describe the use of an iterative Van Cittert deconvolution approach to isolate the LIII-edge from the LII-edge EXAFS and MEXAFS signals for Fe, Co and Ni thin films. The deconvoluted LIII-edge EXAFS data are in agreement with theoretically generated LIII-edge data, thus demonstrating the validity of this approach. Results from the deconvolution of the MEXAFS data also qualitatively agree with previously published MEXAFS data on the same elements at the K-edge. The results for the Fe EXAFS and MEXAFS data will be presented here. copyright 1996 American Institute of Physics
Additional details
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 67
- Journal Issue
- 9
- Journal Page Range
- p. 3365.
- ISSN
- 0034-6748
- CODEN
- RSINAK
Conference
- Title
- synchrotron radiation instrumentation symposium; 7. users meeting for the advanced photon source (APS).
- Acronym
- SRI '95
- Dates
- 16-20 Oct 1995.
- Place
- Argonne, IL (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 28014503
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- FERROMAGNETIC MATERIALS; K SHELL; L SHELL; METALS; RADIATION DETECTORS; SIGNALS; SYNCHROTRON RADIATION; X-RAY SPECTROSCOPY
- Descriptors DEC
- BREMSSTRAHLUNG; ELECTROMAGNETIC RADIATION; ELECTRONIC STRUCTURE; ELEMENTS; MAGNETIC MATERIALS; MATERIALS; MEASURING INSTRUMENTS; RADIATIONS; SPECTROSCOPY
Optional Information
- Secondary number(s)
- CONF-9510119--.