Published September 1996 | Version v1
Journal article

Deconvolution of 3d transition metal L-edge EXAFS and magnetic EXAFS signals

  • 1. Naval Research Laboratory, Code 6685 Code 6345, Washington, DC 20375 (United States)

Description

Due to the closely overlapping L-edge EXAFS regions for the ferromagnetic 3d metals, their analyses have not generally been attempted. Similarly, although analysis of L-edge magnetic EXAFS (MEXAFS) is desirable because of the enhanced amplitude of the signal compared to K-edge MEXAFS, such experiments on the ferromagnetic 3d metals have also not been attempted. In order to address this problem, we describe the use of an iterative Van Cittert deconvolution approach to isolate the LIII-edge from the LII-edge EXAFS and MEXAFS signals for Fe, Co and Ni thin films. The deconvoluted LIII-edge EXAFS data are in agreement with theoretically generated LIII-edge data, thus demonstrating the validity of this approach. Results from the deconvolution of the MEXAFS data also qualitatively agree with previously published MEXAFS data on the same elements at the K-edge. The results for the Fe EXAFS and MEXAFS data will be presented here. copyright 1996 American Institute of Physics

Additional details

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
67
Journal Issue
9
Journal Page Range
p. 3365.
ISSN
0034-6748
CODEN
RSINAK

Conference

Title
synchrotron radiation instrumentation symposium; 7. users meeting for the advanced photon source (APS).
Acronym
SRI '95
Dates
16-20 Oct 1995.
Place
Argonne, IL (United States).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
28014503
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
FERROMAGNETIC MATERIALS; K SHELL; L SHELL; METALS; RADIATION DETECTORS; SIGNALS; SYNCHROTRON RADIATION; X-RAY SPECTROSCOPY
Descriptors DEC
BREMSSTRAHLUNG; ELECTROMAGNETIC RADIATION; ELECTRONIC STRUCTURE; ELEMENTS; MAGNETIC MATERIALS; MATERIALS; MEASURING INSTRUMENTS; RADIATIONS; SPECTROSCOPY

Optional Information

Secondary number(s)
CONF-9510119--.