Published September 1982
| Version v1
Journal article
Low energy Ar+ ion sputtering of liquid and solid indium
Creators
- 1. Physics Department, University of Delaware, Newark, Delaware 19711
Description
Liquid and solid indium targets were bombarded normally by Ar+ ions with energies (E0) ranging from 17 to 180 eV. The relative differential sputtering yields of the In were measured as a function of E0 and target temperature. At E0 = 107 eV, the relative yield of the liquid In was larger than that of the solid In by about 10%. The shapes of the yield versus E0 curves for the liquid and solid In were similar. The threshold of sputtering was about 17 eV for both liquid and solid. The effects of surface topography on sputtering yields seemed to be the same for the liquid and solid In. The higher yield of the liquid In is attributed to its lower binding energy
Additional details
Publishing Information
- Journal Title
- J. Appl. Phys.
- Journal Volume
- 53
- Journal Issue
- 9
- Series
- J. Appl. Phys.
- Journal Page Range
- 6372-6375
- ISSN
- 0021-8979
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 14729817
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- ARGON IONS; BINDING ENERGY; COLLISIONS; ENERGY DEPENDENCE; EV RANGE; EXPERIMENTAL DATA; INDIUM; IRRADIATION; LIQUIDS; SOLIDS; SPUTTERING; TEMPERATURE DEPENDENCE; THRESHOLD ENERGY; TOPOGRAPHY
- Descriptors DEC
- CHARGED PARTICLES; DATA; ELEMENTS; ENERGY; ENERGY RANGE; FLUIDS; INFORMATION; IONS; METALS; NUMERICAL DATA