Published September 1982 | Version v1
Journal article

Low energy Ar+ ion sputtering of liquid and solid indium

  • 1. Physics Department, University of Delaware, Newark, Delaware 19711

Description

Liquid and solid indium targets were bombarded normally by Ar+ ions with energies (E0) ranging from 17 to 180 eV. The relative differential sputtering yields of the In were measured as a function of E0 and target temperature. At E0 = 107 eV, the relative yield of the liquid In was larger than that of the solid In by about 10%. The shapes of the yield versus E0 curves for the liquid and solid In were similar. The threshold of sputtering was about 17 eV for both liquid and solid. The effects of surface topography on sputtering yields seemed to be the same for the liquid and solid In. The higher yield of the liquid In is attributed to its lower binding energy

Additional details

Publishing Information

Journal Title
J. Appl. Phys.
Journal Volume
53
Journal Issue
9
Series
J. Appl. Phys.
Journal Page Range
6372-6375
ISSN
0021-8979

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
14729817
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS;
Resource subtype / Literary indicator
Numerical Data
Descriptors DEI
ARGON IONS; BINDING ENERGY; COLLISIONS; ENERGY DEPENDENCE; EV RANGE; EXPERIMENTAL DATA; INDIUM; IRRADIATION; LIQUIDS; SOLIDS; SPUTTERING; TEMPERATURE DEPENDENCE; THRESHOLD ENERGY; TOPOGRAPHY
Descriptors DEC
CHARGED PARTICLES; DATA; ELEMENTS; ENERGY; ENERGY RANGE; FLUIDS; INFORMATION; IONS; METALS; NUMERICAL DATA