Published 2016
| Version v1
Miscellaneous
Open
Automatic quantitative characterization of phases of refractory ceramics through the integrated mineral analyzer (Tima-Mira)
Creators
- Silva, F.L.1
- Sampaio, N.P.1
- Kruger, F.L.1
- Araujo, F.G.S.1
- Cunha, A.A.1
- Mendes, J.J.1
- Gomes, R.C.2
- Associacao Brasileira de Ceramica (ABCERAM), Sao Paulo, SP (Brazil)
- Associacao Brasileira de Metalurgia, Materiais e Mineracao (ABM), Sao Paulo, SP (Brazil)
- Associacao Brasileira de Polimeros (ABPol), Sao Carlos, SP (Brazil)
- 1. Universidade Federal de Ouro Preto (UFOP), MG (Brazil)
- 2. Faculdade Santa Rita, Sao Paulo, SP (Brazil)
Description
no abstract available
Files
48069678.pdf
Files
(15.6 kB)
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Additional details
Additional titles
- Original title (Portuguese)
- Caracterizacao quantitativa automatica de fases das ceramicas refratarias atraves do analisador mineral integrado (Tima-Mira)
Publishing Information
- Imprint Pagination
- 1 p.
- Report number
- INIS-BR--17883
Conference
- Title
- Brazilian congress of engineering and materials science
- Original Conference Title
- 22. CBECIMAT: congresso brasileiro de engenharia e ciencia dos materiais
- Acronym
- 22. CBECIMAT
- Dates
- 6-10 Nov 2016
- Place
- Natal, RN (Brazil)
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 48069678
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- BACKSCATTERING; CERAMICS; CHEMICAL COMPOSITION; IMAGES; MINERALOGY; OPTICAL MICROSCOPY; SCANNING ELECTRON MICROSCOPY; X-RAY DIFFRACTION; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- CHEMICAL ANALYSIS; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; MICROSCOPY; NONDESTRUCTIVE ANALYSIS; SCATTERING; X-RAY EMISSION ANALYSIS