Published June 16, 2008 | Version v1
Journal article

Effects of the network structure and coupling strength on the noise-induced response delay of a neuronal network

  • 1. Zonguldak Karaelmas University, Engineering Faculty, Department of Electrical and Electronics Engineering, 67100 Zonguldak (Turkey)

Description

The Hodgkin-Huxley (H-H) neuron model driven by stimuli just above threshold shows a noise-induced response delay with respect to time to the first spike for a certain range of noise strengths, an effect called 'noise delayed decay' (NDD). We study the response time of a network of coupled H-H neurons, and investigate how the NDD can be affected by the connection topology of the network and the coupling strength. We show that the NDD effect exists for weak and intermediate coupling strengths, whereas it disappears for strong coupling strength regardless of the connection topology. We also show that although the network structure has very little effect on the NDD for a weak coupling strength, the network structure plays a key role for an intermediate coupling strength by decreasing the NDD effect with the increasing number of random shortcuts, and thus provides an additional operating regime, that is absent in the regular network, in which the neurons may also exploit a spike time code

Availability note (English)

Available from http://dx.doi.org/10.1016/j.physleta.2008.05.003

Additional details

Identifiers

DOI
10.1016/j.physleta.2008.05.003;
PII
S0375-9601(08)00687-7;

Publishing Information

Journal Title
Physics Letters. A
Journal Volume
372
Journal Issue
25
Journal Page Range
p. 4603-4609
ISSN
0375-9601
CODEN
PYLAAG

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40046531
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Descriptors DEI
INTERMEDIATE COUPLING; NEURAL NETWORKS; NOISE; RANDOMNESS; STRONG-COUPLING MODEL; TIME DELAY
Descriptors DEC
COUPLING; MATHEMATICAL MODELS; PARTICLE MODELS

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.