Published April 15, 2002 | Version v1
Journal article

Hopping conduction in GaAs layers grown by molecular-beam epitaxy at low temperatures

  • 1. School of Materials Science, Japan Advanced Institute of Science and Technology, Asahidai 1-1, Tatsunokuchi, Nomigun, Ishikawa 923-1292 (Japan)

Description

The electrical conductivity of GaAs layers grown by molecular-beam epitaxy at low temperatures was studied by using the van der Pauw method. The electrical conductivity of thick GaAs layers grown at temperatures above 200 deg. C changes with the concentration of antisite As atoms following the nearest-neighbor hopping model. From the dependence of the conductivity on the average spacing of antisite As atoms, the Bohr radius of the donor wave function in the hydrogen like model was estimated to be between 2.8 and 4.0 A. The activation energy for hopping conduction changes inversely with the average distance of antisite As atoms. Enhanced incorporation of excess As occurs in the growth of ultrathin GaAs layers at low temperatures. The electrical resistivity of the ultrathin layers is reduced to nearly 1 Ω cm at room temperature by the enhanced incorporation. The activation energy for hopping conduction in the ultrathin layers is significantly lower than that expected from the inversely proportional relation with the average spacing of antisite As atoms

Additional details

Identifiers

Publishing Information

Journal Title
Physical Review. B, Condensed Matter and Materials Physics
Journal Volume
65
Journal Issue
16
Journal Page Range
p. 165311-165311.5
ISSN
1098-0121

Optional Information

Notes
(c) 2002 The American Physical Society