Published May 1992 | Version v1
Journal article Metadata-only

The application of energy-dispersive x-ray fluorescence spectrometry (EDXRF) to the analysis of cosmetic evidence in Indian nail polishes

Creators

  • 1. Forensic Science Lab., Chandigarh (India)
  • 2. Nuclear Research Lab., Srinagar (India)
  • 3. Punjabi Univ., Patiala (India). Dept. of Physics

Description

The application of energy-dispersive x-ray fluorescence (EDXRF) spectrometry in the quantitative analysis of samples of Indian nail polishes of apparently similar shades from different manufacturers has been examined by evaluating the possibility of detecting spurious material which is marketed under the guise of a popular brand. On the basis of the number of elements detected, and from the ratios of particular elements [Fe/Ti,Fe/Cu,Ti/Cu] the results are very encouraging. (author)

Additional details

Publishing Information

Journal Title
Applied Radiation and Isotopes
Journal Volume
43
Journal Issue
5
Series
Appl. Radiat. Isot.
Journal Page Range
609-614
ISSN
0883-2889
CODEN
ARISE

INIS

Country of Publication
United Kingdom
Country of Input or Organization
United Kingdom
INIS RN
23056915
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Descriptors DEI
CONSUMER PRODUCTS; FLUORESCENCE SPECTROSCOPY; IMPURITIES; INDIA; MULTI-ELEMENT ANALYSIS; QUANTITATIVE CHEMICAL ANALYSIS
Descriptors DEC
ASIA; CHEMICAL ANALYSIS; DEVELOPING COUNTRIES; EMISSION SPECTROSCOPY; SPECTROSCOPY