Characterization of a multi-plane electrical capacitance tomography sensor with different numbers of electrodes
Creators
- 1. Institute of Engineering Thermophysics, Chinese Academy of Sciences, Beijing 100190 (China)
- 2. School of Electrical and Electronic Engineering, The University of Manchester, Manchester M13 9PL (United Kingdom)
Description
Choosing the number of electrodes is crucial for a multi-plane electrical capacitance tomography (ECT) sensor to obtain satisfactory capacitance data and good image quality. In this paper, issues with the number of electrodes in three-plane ECT sensors are discussed. The number of electrodes on each plane for the three sensors is 4, 8, and 12, respectively. Three quality measures of resolution matrix, i.e. the amplitude response, relative position error, and spatial resolution, are defined and used for evaluating the preliminary performance of ECT sensors. Based on numerical simulation, the noise-free and noisy capacitance data obtained from the three sensors are used for image reconstruction by linear back projection (LBP) and Landweber iteration algorithms. The image quality is evaluated quantitatively in terms of image error and correlation coefficient. Based on static experiment, the effect of the number of electrodes on the quality of the capacitance data and reconstructed images is also analyzed. According to the numerical simulation and experiment results, the selection of the number of electrodes under different conditions is suggested. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/0957-0233/27/3/035103Additional details
Identifiers
Publishing Information
- Journal Title
- Measurement Science and Technology
- Journal Volume
- 27
- Journal Issue
- 3
- Journal Page Range
- [11 p.]
- ISSN
- 0957-0233
- CODEN
- MSTCEP
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47079412
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ALGORITHMS; AMPLITUDES; CAPACITANCE; COMPUTERIZED SIMULATION; ELECTRODES; ERRORS; IMAGE PROCESSING; IMAGES; NOISE; SENSORS; SPATIAL RESOLUTION; TOMOGRAPHY
- Descriptors DEC
- DIAGNOSTIC TECHNIQUES; ELECTRICAL PROPERTIES; MATHEMATICAL LOGIC; PHYSICAL PROPERTIES; PROCESSING; RESOLUTION; SIMULATION