Published March 2016 | Version v1
Journal article

Characterization of a multi-plane electrical capacitance tomography sensor with different numbers of electrodes

  • 1. Institute of Engineering Thermophysics, Chinese Academy of Sciences, Beijing 100190 (China)
  • 2. School of Electrical and Electronic Engineering, The University of Manchester, Manchester M13 9PL (United Kingdom)

Description

Choosing the number of electrodes is crucial for a multi-plane electrical capacitance tomography (ECT) sensor to obtain satisfactory capacitance data and good image quality. In this paper, issues with the number of electrodes in three-plane ECT sensors are discussed. The number of electrodes on each plane for the three sensors is 4, 8, and 12, respectively. Three quality measures of resolution matrix, i.e. the amplitude response, relative position error, and spatial resolution, are defined and used for evaluating the preliminary performance of ECT sensors. Based on numerical simulation, the noise-free and noisy capacitance data obtained from the three sensors are used for image reconstruction by linear back projection (LBP) and Landweber iteration algorithms. The image quality is evaluated quantitatively in terms of image error and correlation coefficient. Based on static experiment, the effect of the number of electrodes on the quality of the capacitance data and reconstructed images is also analyzed. According to the numerical simulation and experiment results, the selection of the number of electrodes under different conditions is suggested. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/0957-0233/27/3/035103

Additional details

Publishing Information

Journal Title
Measurement Science and Technology
Journal Volume
27
Journal Issue
3
Journal Page Range
[11 p.]
ISSN
0957-0233
CODEN
MSTCEP

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
47079412
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
ALGORITHMS; AMPLITUDES; CAPACITANCE; COMPUTERIZED SIMULATION; ELECTRODES; ERRORS; IMAGE PROCESSING; IMAGES; NOISE; SENSORS; SPATIAL RESOLUTION; TOMOGRAPHY
Descriptors DEC
DIAGNOSTIC TECHNIQUES; ELECTRICAL PROPERTIES; MATHEMATICAL LOGIC; PHYSICAL PROPERTIES; PROCESSING; RESOLUTION; SIMULATION