Published October 14, 1979
| Version v1
Journal article
The effect of the rate of deposition on superconductive properties and structure of tin films
Description
The effect of the real rate of deposition on the superconducting properties and structure of tin films deposited in vacuum on room temperature amorphous substrates has been observed and studied for rates in the 5-200 A s-1 range. It is suggested that the oxygen contamination coefficient K, and thus film purity, changes with the rate of deposition. At higher rates, above 100 A s-1, pure smooth films were obtained, suitable for the fabrication of superconducting tunnel junctions. (author)
Additional details
Publishing Information
- Journal Title
- J. Phys., D (London). Appl. Phys.
- Journal Volume
- 12
- Journal Issue
- 10
- Series
- J. Phys., D (London). Appl. Phys.
- Journal Page Range
- 1781-1785
- ISSN
- 0022-3727
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- United Kingdom
- INIS RN
- 11502024
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- DEPOSITION; FABRICATION; FILMS; GRAIN SIZE; HIGH VACUUM; IMPURITIES; JOSEPHSON JUNCTIONS; MEDIUM TEMPERATURE; OXYGEN; SUBSTRATES; SUPERCONDUCTING JUNCTIONS; SUPERCONDUCTIVITY; TIN; TRANSITION TEMPERATURE; TUNNEL EFFECT
- Descriptors DEC
- CRYSTAL STRUCTURE; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELEMENTS; METALS; MICROSTRUCTURE; NONMETALS; PHYSICAL PROPERTIES; SEMICONDUCTOR JUNCTIONS; SIZE; THERMODYNAMIC PROPERTIES