Published 1978
| Version v1
Journal article
Piezoresistance effect in Pbsub(0.82)Snsub(0.18)Te films
Description
Piezoresistance coefficient of longitudinal and transverse strain sensitivity has been measured in n- and p-type Pbsub(0.82)Snsub(0.18)Te films prepared on mica substrates and oriented in [111] direction. An attempt has been made to explain the dependence of the gauge factor on the angle between the stress direction and the current. (author)
Additional details
Publishing Information
- Journal Title
- Electron Technol.
- Journal Volume
- 11
- Journal Issue
- 1-2
- Series
- Electron Technol.
- Journal Page Range
- 75-83
INIS
- Country of Publication
- Poland
- Country of Input or Organization
- Poland
- INIS RN
- 12583961
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- CHEMICAL COATING; CHEMICAL COMPOSITION; ELECTRICAL PROPERTIES; FILMS; LEAD TELLURIDES; PIEZOELECTRICITY; STRAIN SOFTENING; SUBSTOICHIOMETRY; TIN TELLURIDES
- Descriptors DEC
- CHALCOGENIDES; DEPOSITION; ELECTRICITY; LEAD COMPOUNDS; PHYSICAL PROPERTIES; SURFACE COATING; TELLURIDES; TELLURIUM COMPOUNDS; TIN COMPOUNDS