Published 1993 | Version v1
Book

Thin film NaI(Tl) scintillators for high-resolution large-area imaging of soft x-rays

  • 1. Univ. of Virginia, Charlottesville, VA (United States)

Description

The authors are developing NaI(Tl) phosphors to use on large-area, photon-counting imaging photomultiplier tubes. An x-ray absorption uniformity of 99% is expected over an area of 133 cm2 at a film thickness of 38 ± 1.5 microm. The spatial resolution f the scintillator films, up to 61 microm thick, is consistent with a total detector resolution of less than 92 microm, given a phototube resolution of 65 microm fwhm. The fwhm for 8 keV spots is presented as a function of angle up to 40 degrees off-incidence and a simple model for the broadening of the fwhm due to parallax is presented. Improvements of 20% in the light-collection efficiency were observed for fiber optic disks coated with potassium silicate before vapor-depositing the NaI(Tl). The authors present absolute scintillating energy efficiency measurements by comparing the films to the scintillation of single crystal NaI(Tl)

Additional details

Publishing Information

Publisher
SPIE--The International Society for Optical Engineering.
Imprint Place
Bellingham, WA (United States)
ISBN
0-8194-1258-9
Imprint Title
X-ray detector physics and applications II
Imprint Pagination
283 p.
Series
Proceedings/SPIE, Volume 2009.
Journal Page Range
p. 109-120.

Conference

Title
Annual meeting of the Society of Photo-Optical Instrumentation Engineers (SPIE).
Dates
11-16 Jul 1993.
Place
San Diego, CA (United States).

Optional Information

Secondary number(s)
CONF-930722--.