Published February 21, 2009
| Version v1
Journal article
Doping of silicate glasses with erbium by a field-assisted solid-state ion exchange technique
- 1. Dipartimento di Chimica Fisica, Universita Ca Foscari Venezia, Dorsoduro 2137, I-30123 Venezia (Italy)
- 2. CNR-INFM-OGG, c/o European Synchrotron Radiation Facility, 6 rue J. Horowitz, BP 220, F-38043 Grenoble (France)
- 3. Dipartimento di Fisica, Universita degli Studi di Padova, via Marzolo 8, I-35131 Padova (Italy)
Description
A field-assisted solid-state ion exchange technique is used for the first time to dope surface layers of silicate glasses with erbium at the concentration of the order of a few 1020 Er cm-3. Rutherford backscattering spectrometry, extended x-ray absorption fine structure spectroscopy and photoluminescence spectroscopy are used to characterize the samples treated after erbium oxide films were formed on soda-lime glass slides.
Availability note (English)
Available from http://dx.doi.org/10.1088/0022-3727/42/4/045301Additional details
Identifiers
- DOI
- 10.1088/0022-3727/42/4/045301;
- PII
- S0022-3727(09)90925-1;
Publishing Information
- Journal Title
- Journal of Physics. D, Applied Physics
- Journal Volume
- 42
- Journal Issue
- 4
- Journal Page Range
- [5 p.]
- ISSN
- 0022-3727
- CODEN
- JPAPBE
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41125600
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; ERBIUM; ERBIUM OXIDES; FILMS; FINE STRUCTURE; GLASS; ION EXCHANGE; LAYERS; PHOTOLUMINESCENCE; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SILICATES; SODIUM CARBONATES; SOLIDS; X-RAY SPECTROSCOPY
- Descriptors DEC
- ALKALI METAL COMPOUNDS; CARBON COMPOUNDS; CARBONATES; CHALCOGENIDES; ELEMENTS; EMISSION; ERBIUM COMPOUNDS; LUMINESCENCE; METALS; OXIDES; OXYGEN COMPOUNDS; PHOTON EMISSION; RARE EARTH COMPOUNDS; RARE EARTHS; SILICON COMPOUNDS; SODIUM COMPOUNDS; SPECTROSCOPY