Published February 2021 | Version v1
Journal article

Application of near-ambient pressure X-ray photoelectron spectroscopy (NAP-XPS) in an in-situ analysis of the stability of the surface-supported metal-organic framework HKUST-1 in water, methanol and pyridine atmospheres

  • 1. Bundesanstalt für Materialforschung und –prüfung, 12200, Berlin (Germany)
  • 2. SPECS Surface Nano Analysis GmbH, Voltastraße 5, 13355, Berlin (Germany)
  • 3. Institute of Functional Interfaces, Karlsruhe Institute of Technology (KIT), 76131, Karlsruhe (Germany)

Description

Surface-supported metal-organic frameworks HKUST-1 (Hong Kong University of Science and Technology) were used as a model system for a development of a near ambient pressure (NAP) XPS based approach to investigate interaction with atmospheres of water, methanol or pyridine at pressures ranging from 1 to 4 mbar. The films were grown on a gold substrate functionalized with a COOH-terminated self-assembled monolayer using liquid-phase epitaxy in a step-by-step fashion. Measurement protocols were developed and optimised for different gases in order to obtain spectra of similar quality in terms of signal intensity, noise and shape. Peak shapes were found to depend on the efficiency of charge compensation. Reference measurements in argon proved to be a useful strategy not only for the evaluation of the Cu(II)-fraction in pristine samples, but also to identify the contributions by the respective gas atmosphere to the C 1s and O 1s photoelectron spectra. Reduced copper was found during the exposition of HKUST-1 to water vapour and pyridine, but this effect was not observed in case of methanol. Additionally, it was established that there are no changes in relative Cu(II) percentage with increasing exposure time. This indicates that saturation was reached already at the lowest time of gas exposure. A detailed elucidation of the mechanism of Cu(II) reduction to Cu(I) in HKUST-1 mediated by water and pyridine is part of ongoing work and not in the scope of the present paper.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.elspec.2020.147042

Additional details

Identifiers

DOI
10.1016/j.elspec.2020.147042;
PII
S0368204820301067;

Publishing Information

Journal Title
Journal of Electron Spectroscopy and Related Phenomena
Journal Volume
247
Journal Page Range
vp.
ISSN
0368-2048
CODEN
JESRAW

Optional Information

Copyright
Copyright (c) 2020 Published by Elsevier B.V.