Published April 1, 1992
| Version v1
Journal article
The defects and intergrowth of lead oxides revealed by HRTEM
Creators
- 1. Lab. of Atomic Imaging of Solids, Inst. of Metal Research, Academia Sinica, Shenyang (China)
- 2. Beijing Lab. of Electron Microscopy, Academia Sinica (China)
- 3. Inst. of Geochemistry, Academia Sinica, Guiyang (China)
Description
High-resolution transmission electron microscopy (HRTEM) and electron diffraction were used to investigate the microstructure of natural lead oxides found in Panzhihua Mountain, China. The electron diffraction patterns showed crossing of diffraction spots along <110> directions in litharge and along <100> directions in massicot and the structural images showed the domain-like texture, probably constructed by arrays of planar defects in the fundamental structures. Based upon the structure of these oxides the possible structural models of planar defects are discussed and the orientation relationship of litharge and massicot is determined. (orig.)
Additional details
Publishing Information
- Journal Title
- Journal of Applied Crystallography
- Journal Volume
- 25
- Journal Issue
- 2
- Series
- J. Appl. Crystallogr.
- Journal Page Range
- 199-204
- ISSN
- 0021-8898
- CODEN
- JACGA
INIS
- Country of Publication
- Denmark
- Country of Input or Organization
- Denmark
- INIS RN
- 23074426
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CRYSTAL DEFECTS; ELECTRON DIFFRACTION; LEAD OXIDES; MINERALS; STACKING FAULTS; STRUCTURAL MODELS; TRANSMISSION ELECTRON MICROSCO
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; CRYSTAL STRUCTURE; DIFFRACTION; ELECTRON MICROSCOPY; LEAD COMPOUNDS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; SCATTERING